Adaptable ferroelectric memories for space applications

Proceedings 2004 Non-Volatile Memory Technology Symposium, NVMTS 2004

Volumn , Issue , 2004, Pages 149-152

  Kamp, David A ^a   DeVilbiss, Alan D ^a   Philpy, Stephen C ^a   Derbenwick, Gary F ^a  

^a Celis Semiconductor Corporation   (United States)

Author keywords

Adaptability; Ferroelectric memory; Hardened by design; Radiation hardened; Space applications

Indexed keywords

ADAPTABILITY; FERROELECTRIC MEMORY; HARDENED-BY-DESIGN; RADIATION-HARDENED;

DURABILITY; FERROELECTRIC MATERIALS; FLASH MEMORY; IONIZATION; PRODUCT DESIGN; SEMICONDUCTOR MATERIALS; SPACE APPLICATIONS;

DATA STORAGE EQUIPMENT;

EID: 18844415840     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

1. S. C. Philpy, D. A. Kamp and G. F. Derbenwick, "Hardened By Design Ferroelectric Memories for Space Applications," Non-Volatile Memory Technology Symposium. San Diego, California, Nov. 11-13, 2003.
2. S. C. Philpy, D. A. Kamp, T. A. Meester, A. D. DeVilbiss, A. F. Isaacson and G. F. Derbenwick, "Reliability of Ferroelectric Memory for High-Rel and Space Applications," 2nd Annual Microelectronics Reliability and Qualification Workshop, 1999.
3. S. C. Philpy, D. A. Kamp, A. D. DeVilbiss, A. F. Isaacson and G. F. Derbenwick, "Ferroelectric Memory Technology for Aerospace Applications," IEEE Aerospace Conference, 2000.
4. D. R. Alexander, D. G. Mavis, R. M. Turfler, J. R. Bailey, and M. Williams, "A Scaleable HBD Cell Library for Radiation-Tolerant ASICs for Space Applications," Government Microcircuit Applications Conference, 2001.
5. D. R. Alexander, "Cost Assessments for Rad Hard Microcircuits for Space Fabricated in Commercial Technologies," Government Microcircuit Applications Conference, 2002.
6. D. A. Kamp, "Ferroelectric memory with shunted isolated nodes," U.S. Patent 6 256 220, July 3, 2001.
7. J. Yamada, T. Miwa, H. Koike, H. Toyoshima, K. Amanuma, S. Kobayashi, T. Tatsumi, Y. Maejima, H. Hada, H. Mori, S. Takahashi, H. Takeuchi, and T. Kunio, "A 128-kb FeRAM Macro for Contact/Contactless Smart-Card Microcontrollers," IEEE J. Solid-State Circuits, vol. 37, pp. 1073-1079, Aug. 2002.