Dejvelopment of highly-ordered, ferroelectric inverse opal films using sol-gel infiltration

Applied Physics A: Materials Science and Processing

Volumn 81, Issue 2, 2005, Pages 379-384

  Matsuura, N ^a   Yang, S ^a   Sun, P ^a   Ruda, H E ^a  

^a UNIVERSITY OF TORONTO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DIELECTRIC PROPERTIES; DOPING (ADDITIVES); HEAT TREATMENT; INFILTRATION; LEAD; LIGHT REFLECTION; POLYSTYRENES; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; SOL-GELS;

CRACK-FREE TEMPLATES; INVERSE OPAL FILMS; PRECURSORS; TEMPLATE HEATING;

FERROELECTRIC THIN FILMS;

EID: 18844405166     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00339-004-2562-9     Document Type: Article

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