Single nanotube Raman spectroscopy

Accounts of Chemical Research

Volumn 35, Issue 12, 2002, Pages 1070-1078

  Dresselhaus, M S ^a   Dresselhaus, G ^b   Jorio, A ^c,d   Souza Filho, A G ^c,e   Pimenta, M A ^e   Saito, R ^f  

^a Department of Electrical Engineering and Computer Science   (United States)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^c MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^d FEDERAL UNIVERSITY OF MINAS GERAIS   (Brazil)

^e FEDERAL UNIVERSITY OF CEARÁ   (Brazil)

^f UNIVERSITY OF ELECTRO COMMUNICATIONS   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON;

ATOMIC FORCE MICROSCOPY; ELECTRONICS; MATERIAL STATE; MATERIALS; NANOPARTICLE; NANOTUBE; RAMAN SPECTROMETRY; REVIEW; SEMICONDUCTOR; SPECTROSCOPY; STRUCTURE ANALYSIS;

EID: 0036929467     PISSN: 00014842     EISSN: None     Source Type: Journal    
DOI: 10.1021/ar0101537     Document Type: Review

References (25)

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