Monte Carlo estimation of noise-parameter uncertainties

IEE Proceedings: Science, Measurement and Technology

Volumn 149, Issue 6, 2002, Pages 333-337

  Randa, J ^a   Wiatr, W ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); COMPUTER SIMULATION; ELECTRIC POWER MEASUREMENT; LEAST SQUARES APPROXIMATIONS; MATHEMATICAL MODELS; MONTE CARLO METHODS; NONLINEAR EQUATIONS; PARAMETER ESTIMATION; SCATTERING PARAMETERS; TEMPERATURE;

LOW NOISE AMPLIFIER; NOISE PARAMETER MEASUREMENTS; NOISE PARAMETER UNCERTAINTIES;

SIGNAL NOISE MEASUREMENT;

EID: 0036875256     PISSN: 13502344     EISSN: None     Source Type: Journal    
DOI: 10.1049/ip-smt:20020488     Document Type: Article

References (16)

1. Davidson, A.C., Leake, B.W., and Strid, E.: 'Accuracy improvements in microwave noise parameter measurements', IEEE Trans. Microw. Theory Tech., 1989, 37, pp. 1973-1978
2. Schmatz, M.L., Benedickter, H.R,. and Bächtold, W.: 'Accuracy improvements in microwave noise parameter determination', 51st ARFTG Conference, Baltimore, MD, USA, 1998
3. Van Den Bosch, S., and Martens, L.: 'Improved impedance-pattern generation for automatic noise-parameter determination', IEEE Trans. Microw. Theory Tech., 1998, 46, pp. 1673-1678
4. Randa, J., and Wiatr, W.: 'Noise parameter uncertainties from Monte Carlo simulations', British Electromagnetic Measurement Conference, Harrogate, U.K., November 2001
5. Lane, R.Q.: 'The determination of device noise parameters', Proc. IEEE, 1969 1969, 57, pp. 1461-1462
6. Engen, G.F.: 'A new method of characterizing amplifier noise performance', IEEE Trans. Instrum. Meas., 1970, 19, (4), pp. 344-349
7. Adamian, V., and Uhlir, A.: 'A novel procedure for receiver noise characterization', IEEE Trans. Instrum. Meas., 1973, 22, (2), pp. 181-182
8. Wedge, S.W., and Rutledge, D.B.: 'Wave techniques for noise modeling and measurement', IEEE Trans. Microw. Theory Tech., 1992, 40, pp. 2004-2012
9. Haus, H. et al.: 'IRE standards on methods of measuring noise in linear twoports 1959', Proc. IRE, 1960, 48, pp. 60-68
10. Press, W.H., Flannery, B.P., Teukolsky, S.A., and Vetterling, W.T., 'Numerical Recipes', (Cambridge University Press, Cambridge, 1986), Chap. 14.5
11. Wiatr, W.: 'Accuracy verification of a technique for noise and gain characterization of two-ports', 10th Microwave Conf. MIKON 94, Ksiaz, Poland, 1994, pp. 525-529
12. Wiatr, W.: 'Characterization of radiometer using eight-term linear model', IEEE Trans. Instrum. Meas., 1995, 44, (2), pp. 343-346
13. 'ISO Guide to the Expression of Uncertainty in Measurement', Int. Org. Standard., Geneva, Switzerland, 1993
14. Taylor, B.N., and Kuyatt, C.E.: 'Guidelines for evaluating and expressing the uncertainty of NIST measurement results'. NIST tech. note 1297, Gaithersburg, MD, USA, 1994
15. Daywitt, W.C.: 'A coaxial noise standard for the 1 to 12.4 GHz frequency range'. NIST tech. note 1074, Boulder, CO, USA, 1984
16. Randa, J.: 'Uncertainties in NIST noise-temperature measurements'. NISt tech. note 1502, Boulder, CO, USA, 1998