Simulations of noise-parameter uncertainties

IEEE MTT-S International Microwave Symposium Digest

Volumn 3, Issue , 2002, Pages 1845-1848

  Randa, J ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); COMPUTER SIMULATION; ELECTRIC IMPEDANCE; LEAST SQUARES APPROXIMATIONS; MONTE CARLO METHODS; PARAMETER ESTIMATION; RADIOMETERS; REFLECTION; TEMPERATURE MEASUREMENT; THERMAL NOISE;

DEVICE UNDER TEST; HOT NOISE SOURCE; INPUT TERMINATIONS; NOISE PARAMETER UNCERTAINTIES; NOISE TEMPERATURE MEASUREMENT;

SIGNAL NOISE MEASUREMENT;

EID: 0036067714     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

1. Accuracy improvements in microwave noise parameter measurements
2. Accuracy improvements in microwave noise parameter determination
3. Improved impedance-pattern generation for automatic noise-parameter determination
4. Noise parameter uncertainties from Monte Carlo simulations
5. Monte Carlo estimation of noise-parameter uncertainties
6. A novel procedure for receiver noise characterization
7. IRE standards on methods of measuring noise in linear twoports 1959