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Volumn 97, Issue 9, 2005, Pages

Depth analysis of the in-plane lattice constants in compressively strained La 0.67 Ca 0.33 MnO 3 thin films

Author keywords

[No Author keywords available]

Indexed keywords

HETROEPITAXIAL GROWTH; LATTICE MISMATCH; LATTICE RELAXATION; STRUCTURAL STRAIN;

EPITAXIAL GROWTH; FERROMAGNETISM; LATTICE CONSTANTS; PULSED LASER DEPOSITION; THICKNESS MEASUREMENT; X RAY DIFFRACTION;

THIN FILMS;

EID: 18844370408 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.1884761 Document Type: Article

Times cited : (6)

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