Measurements of the optical functions of uniaxial crystals using 2-modulator generalized ellipsometry (2-MGE)

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3425, Issue , 1998, Pages 232-238

  Jellison Jr , Gerald E ^a   Modine, Frank A ^a   Boatner, Lynn A ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

Dielectric functions; Ellipsometry; Refractive index; Uniaxial materials

Indexed keywords

CRYSTALS; ELLIPSOMETRY; ENERGY GAP; LIGHT REFLECTION; LIGHT TRANSMISSION; OPTICAL VARIABLES MEASUREMENT; PHOTONS; REFRACTIVE INDEX;

OPTICAL FUNCTIONS; UNIAXIAL MATERIALS;

OPTICAL MATERIALS;

EID: 0032401449     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.326667     Document Type: Conference Paper

References (19)