Reflection high-energy electron diffraction analysis of polycrystalline films with grain size and orientation distributions

Journal of Applied Physics

Volumn 92, Issue 9, 2002, Pages 5133-5139

  Hartman, J W ^a   Brewer, R T ^a   Atwater, Harry A ^a  

^a California Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AVERAGE GRAIN SIZE; COMPUTATIONALLY EFFICIENT; GRAIN SIZE; IN-PLANE ORIENTATION; INTENSITY MAPS; ORIENTATION DISTRIBUTIONS; POLYCRYSTALLINE FILM; TEXTURE DISTRIBUTIONS;

ALGORITHMS; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;

GRAIN SIZE AND SHAPE;

EID: 18744392000     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1510954     Document Type: Article

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