What information can be obtained by RHEED applied on polycrystalline films?

Surface Science

Volumn 360, Issue 1-3, 1996, Pages 289-296

  Andrieu, Stéphane ^a   Fréchard, Patrick ^a  

^a CNRS   (France)

Author keywords

Electron solid diffraction; Electron solid interactions, scattering, diffraction; Growth; Iron; Molecular beam epitaxy; Polycrystalline thin films; Reflection high energy electron diffraction (RHEED); Surface structure, morphology, roughness, and topography

Indexed keywords

CRYSTAL ORIENTATION; CRYSTALLOGRAPHY; IRON; MOLECULAR BEAM EPITAXY; MORPHOLOGY; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SURFACE ROUGHNESS; TEXTURES; THIN FILMS;

ELECTRON SOLID DIFFRACTION; ELECTRON SOLID INTERACTIONS; ELECTRON SOLID SCATTERING; SURFACE TOPOGRAPHY;

POLYCRYSTALLINE MATERIALS;

EID: 0030195144     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(96)00303-2     Document Type: Article

References (9)

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