Microwave characterization of ferroelectric thin-film materials

IEEE Transactions on Microwave Theory and Techniques

Volumn 53, Issue 4 I, 2005, Pages 1390-1396

  Ouaddari, Mossaab ^a   Delprat, Sébastien ^b   Vidal, François ^b   Chaker, Mohamed ^b   Wu, Ke ^a  

^a POLY GRAMES RESEARCH CENTER   (Canada)

^b INRS EMT   (Canada)

Author keywords

Conformal mapping; Coplanar waveguide (CPW); Dielectric constant characterization; Ferroelectric thin films; Interdigital capacitors (IDCs); Tunable device

Indexed keywords

ALUMINA; CALIBRATION; CAPACITORS; COMPUTER AIDED DESIGN; CONFORMAL MAPPING; ELECTRIC POTENTIAL; FERROELECTRIC MATERIALS; FREQUENCIES; MICROWAVES; PERMITTIVITY; WAVEGUIDES;

DIELECTRIC CONSTANT CHARACTERIZATION; INTERDIGITAL CAPACITORS (IDC); TUNABLE DEVICE; VOLTAGE TUNABILITY;

FERROELECTRIC THIN FILMS;

EID: 18744371928     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2005.845759     Document Type: Article

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