Origin of MeV ion irradiation-induced stress changes in SiO2

Journal of Applied Physics

Volumn 88, Issue 1, 2000, Pages 59-64

  Brongersma, M L ^a   Snoeks, E ^a   Van Dillen, T ^a   Polman, A ^a  

^a FOM INSTITUTE AMOLF   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0002027998     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.373624     Document Type: Article

References (22)

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