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Volumn 11, Issue 5, 2002, Pages 686-690

Nanoscale fabrication using single-ion impacts

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON NANOTUBES; CHEMICAL MODIFICATION; HELIUM; ION IMPLANTATION; NANOSTRUCTURED MATERIALS; PHOTORESISTS; POLYMETHYL METHACRYLATES; QUANTUM THEORY; SEMICONDUCTING SILICON;

EID: 18644362236     PISSN: 09641726     EISSN: None     Source Type: Journal    
DOI: 10.1088/0964-1726/11/5/310     Document Type: Article
Times cited : (6)

References (15)
  • 3
    • 0032516155 scopus 로고    scopus 로고
    • A silicon-based nuclear spin quantum computer
    • Kane B.E. 1998 A silicon-based nuclear spin quantum computer Nature 393 133-7.
    • (1998) Nature , vol.393 , pp. 133-137
    • Kane, B.E.1
  • 10
    • 0011183597 scopus 로고    scopus 로고
    • Demonstration of single ion impact on Si(001) surface using a self-assembled organic monolayer of 1, 3, 5, 7-cyclooctatetraene
    • at press
    • Andrienko I.V., Cimmino A., Jamieson D.N. and Prawer S.D. 2001 Demonstration of single ion impact on Si(001) surface using a self-assembled organic monolayer of 1, 3, 5, 7-cyclooctatetraene Proc. IQC 01: Quantum Information and Computation at press.
    • (2001) Proc. IQC 01: Quantum Information and Computation
    • Andrienko, I.V.1    Cimmino, A.2    Jamieson, D.N.3    Prawer, S.D.4
  • 13
    • 0345466408 scopus 로고    scopus 로고
    • Direct growth of single-walled carbon nanotube scanning probe microscopy tips
    • Hafner J.H., Cheung C.L. and Lieber C.M. 1999 Direct growth of single-walled carbon nanotube scanning probe microscopy tips J. Am. Chem. Soc. 121 9750-1.
    • (1999) J. Am. Chem. Soc. , vol.121 , pp. 9750-9751
    • Hafner, J.H.1    Cheung, C.L.2    Lieber, C.M.3
  • 14
    • 0035442319 scopus 로고    scopus 로고
    • Carbon nanotube tip probes: Stability and lateral resolution in scanning probe microscopy and application to surface science in semiconductors
    • Nguyen C.V., Chao K.-J., Stevens R.M.D., Delzeit L., Cassell A., Han J. and Meyyappan M. 2001 Carbon nanotube tip probes: stability and lateral resolution in scanning probe microscopy and application to surface science in semiconductors Nanotechnology 12 363-7.
    • (2001) Nanotechnology , vol.12 , pp. 363-367
    • Nguyen, C.V.1    Chao, K.-J.2    Stevens, R.M.D.3    Delzeit, L.4    Cassell, A.5    Han, J.6    Meyyappan, M.7


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.