A gel-based wafer-level testing procedure for microelectrodes

Sensors and Actuators, B: Chemical

Volumn 107, Issue 2, 2005, Pages 557-562

  Kindlundh, Maria ^a   Norlin, Peter ^a  

^a ACREO AB   (Sweden)

Author keywords

Impedance characterisation; Microelectrode; Neural probe; Saline gel; Wafer level testing

Indexed keywords

BIOELECTRIC PHENOMENA; ELECTRIC CONDUCTORS; ELECTRIC IMPEDANCE; ELECTROLYTES; ELECTRON BEAMS; EQUIPMENT TESTING; EVAPORATION; GELS; PROBES; SIGNAL TO NOISE RATIO; WSI CIRCUITS;

IMPEDANCE CHARACTERIZATION; NEURAL PROBES; SALINE GELS; WAFER-LEVEL TESTING;

MICROELECTRODES;

EID: 18544385477     PISSN: 09254005     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.snb.2004.11.016     Document Type: Article

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