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Volumn 78, Issue 2-4, 2005, Pages 217-221
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Fractal analysis of roughness profile induced by ion bombardment of metal surface
b
ComputerLand SA
*
(Poland)
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Author keywords
Fractal analysis; Ion beam sputtering; Stainless steel; Surface roughness; Surface topography
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
FRACTALS;
ION BEAMS;
ION BOMBARDMENT;
ION IMPLANTATION;
METAL ANALYSIS;
PROFILOMETRY;
SPUTTERING;
STAINLESS STEEL;
SURFACE TOPOGRAPHY;
SURFACE TREATMENT;
FRACTAL ANALYSIS;
ION BEAM IRRADIATION;
ION BEAM SPUTTERING;
ION ENERGY;
SURFACE ROUGHNESS;
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EID: 18444380267
PISSN: 0042207X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.vacuum.2005.01.029 Document Type: Conference Paper |
Times cited : (8)
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References (13)
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