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Volumn 44, Issue 7-8, 2004, Pages 767-774

Self-calibration algorithm for testing out-of-plane errors of two-dimensional profiling stages

Author keywords

Artifact error; Calibration; Out of plane error motion; Profile measurement; Self calibration; Two dimensional stages

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; COST EFFECTIVENESS; ERROR ANALYSIS; INTERFEROMETERS; LINEAR EQUATIONS; MECHANICAL TESTING;

EID: 1842854073     PISSN: 08906955     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijmachtools.2004.01.017     Document Type: Article
Times cited : (27)

References (8)
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  • 2
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  • 3
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    • Donaldson, R.1
  • 4
    • 0030399387 scopus 로고    scopus 로고
    • Self-calibration: Reversal, redundancy, error separation, and absolute testing
    • Evans C., Hocken R.J., Estler W.T. Self-calibration: reversal, redundancy, error separation, and absolute testing. Annals of the CIRP. 45:(2):1996;617-634.
    • (1996) Annals of the CIRP , vol.45 , Issue.2 , pp. 617-634
    • Evans, C.1    Hocken, R.J.2    Estler, W.T.3
  • 5
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    • Absolute two-dimensional sub-micron metrology for electron beam lithography: A calibration theory with applications
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    • (1985) Precision Engineering , vol.7 , Issue.1 , pp. 3-13
    • Raugh, M.1
  • 7
    • 0030694908 scopus 로고    scopus 로고
    • An exact algorithm for self-calibration of two-dimensional precision metrology stages
    • Ye J., Takac M., Berglund C.N., Owen G., Pease R.F. An exact algorithm for self-calibration of two-dimensional precision metrology stages. Precision Engineering. 20:(1):1997;16-32.
    • (1997) Precision Engineering , vol.20 , Issue.1 , pp. 16-32
    • Ye, J.1    Takac, M.2    Berglund, C.N.3    Owen, G.4    Pease, R.F.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.