Test optics error removal

Applied Optics

Volumn 35, Issue 7, 1996, Pages 1015-1021

  Evans, Chris J ^a   Kestner, Robert N ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b Tinsley Lab Inc   (United States)

Author keywords

Interferometers; Optical testing; Zernike polynomials

Indexed keywords

EID: 0001065843     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.35.001015     Document Type: Article

References (23)

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22. Kuchel, in reviewing a draft of this manuscript, derived an alternative proof based on a Fourier series expansion of any arbitrary azimuthal profile that is concentric with the axis about which the part is rotated.
23. The notation used here is that proposed by the NAPM IT 11 Standards Committee on Interferometric Testing, in which the subscript refers to the maximum radial order whereas the superscript gives the azimuthal order, with a negative sign indicating the sine 1rather than cosine term.