Thickness dependence of the current density distribution in superconducting films

Physica C: Superconductivity and its Applications

Volumn 404, Issue 1-4, 2004, Pages 220-225

  Laviano, F ^a   Botta, D ^a   Gerbaldo, R ^a   Ghigo, G ^a   Gozzelino, L ^a   Gianni, L ^b   Zannella, S ^b   Mezzetti, E ^a  

^a POLITECNICO DI TORINO   (Italy)

^b Edison Spa   (Italy)

Author keywords

Critical currents; Magneto optics; Superconducting films

Indexed keywords

ASPECT RATIO; ATOMIC FORCE MICROSCOPY; CORRELATION METHODS; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); ENERGY DISPERSIVE SPECTROSCOPY; EVAPORATION; MAGNETOOPTICAL EFFECTS; MICROSTRUCTURE; PROBLEM SOLVING; SAMPLING; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

PENETRATION DEPTH; THICKNESS DEPENDENCE;

SUPERCONDUCTING FILMS;

EID: 1842841277     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physc.2003.11.045     Document Type: Conference Paper

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