Thickness and roughness dependence of magnetic flux penetration and critical current densities in YBa2Cu3O7-δ thin films

Physica C: Superconductivity and its Applications

Volumn 266, Issue 3-4, 1996, Pages 235-252

  Jooss, Ch ^a   Forkl, A ^a   Warthmann, R ^a   Habermeier, H U ^b   Leibold, B ^b   Kronmuller H ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CALCULATIONS; CALIBRATION; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); FARADAY EFFECT; MAGNETIC FIELDS; MAGNETOOPTICAL EFFECTS; MATHEMATICAL MODELS; ROUGHNESS MEASUREMENT; SURFACE ROUGHNESS; THICKNESS MEASUREMENT; YTTRIUM COMPOUNDS;

BEAN MODEL; FLUX PINNING; ISLAND GROWTH MODE; MAGNETIC FLUX; MAGNETIC FLUX DENSITY; NONLINEAR CALIBRATION TECHNIQUE; SURFACE PINNING; VORTEX LINE;

SUPERCONDUCTING FILMS;

EID: 0030212312     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/0921-4534(96)00339-5     Document Type: Article

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