Breakdown of Al/AlOx/Al Tunneling Junctions

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 43, Issue 1, 2004, Pages 197-200

  Morozumi, Takeshi ^a   Kaiju, Hideo ^a   Ohtaka, Yuki ^a   Shiiki, Kazuo ^a  

^a KEIO UNIVERSITY   (Japan)

Author keywords

Barrier height; Ion beam sputtering; Schottky leak current; Tunneling junction; Zener breakdown

Indexed keywords

ALUMINUM; CURRENT DENSITY; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONDUCTIVITY; ELECTRIC RESISTANCE; GLASS; ION BEAMS; OXIDATION; OXYGEN; SPUTTERING; ZENER EFFECT;

BARRIER HEIGHT; ION-BEAM SPUTTERING; SCHOTTKY LEAK CURRENT;

TUNNEL JUNCTIONS;

EID: 1842709991     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.43.197     Document Type: Article

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