Ferroelectric-Semiconductor UV Sensors

Physica Status Solidi (A) Applied Research

Volumn 185, Issue 1, 2001, Pages 115-120

  Suchaneck, G ^a   Gerlach, G ^a  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 1842638250     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-396X(200105)185:1<115::AID-PSSA115>3.0.CO;2-6     Document Type: Article

References (18)

1. V. P. AFANASJEV and G. F. KRAMAR, Ferroelectrics 143, 299 (1993).
2. V. P. AFANASJEV, G. P. KRAMAR, and A. V. SOSNIN, Physical Processes in Ferroelectric - Semiconductor Structures under Optical and Thermal Excitation, Institute of Applied Optics, Kiyv, 1998 (in Russian).
3. V. P. AFANASJEV, G. P. KRAMAR, A. V. PANKRASHKIN, G. SUCHANECK, R. KOEHLER, and G. GERLAGH, Proc. Internat. Workshop Russian Technologfes for Industrial Applications 2000, St. Petersburg, May 29-31, 2000 (p. 59) Russian Foundation for Basic Research, St. Petersburg 2000.
4. B. A. TUTTLE, D. C. MCINTYRE, C. H. SEAGER, T. J. GARINO, W. L. WARREN, J. T. EVANS, and W. WALDMAN, Mater. Res. Soc. Symp. Proc. 310, 71 (1993).
5. H. FUJISAWA, S. AGGARWAL, and R. RAMESH, 11th Internat. Symp. Integrated Ferroelectrics, Colorado Springs (CO), March 7-10, 1999, Abstract 167P University of Colorado, Colorado Springs 1999.
6. W. P. LI, R. ZHANG, J. YIN, X. H. LIU, Y. G. ZHOU, B. CHEN, P. CHEN, Z. Z. CHEN, Y. SHI, R. L. JIANG, Z. G. LIU, Y. D. ZHENG, and Z. C. HUANG, MRS Internet J. Nitride Semicond. Res. 5S1, W11.5 (2000).
7. A. F. MCKINLEY and B. L. DIFFEY, CIE (International Commission on Illumination) Research Note; CIE J. 6, 17 (1987).
8. N. W. ASHROFT and N. D. MERMIN, Solid State Physics, Holt, Rinehart and Winston, New York 1976.
9. M. DIDOMENICO and S. H. WEMPLE, J. Appl. Phys. 40, 720 (1969).
10. J. I. PANKOVE, Optical Properties of Semiconductors, Dover/New York 1975.
11. F. URBACH, Phys. Rev. 92, 1324 (1953).
12. P. I. ROVIRA and R. W. COLLINS, J. Appl. Phys. 85, 2015 (1999).
13. n.k database, A.F. Joffe Physico-Technical Institute, St. Petersburg (Russia), http://www.ioffe.rssi.ru/SVA/NSM/nk/index-html
14. Optical Data from Sopra SA, http://www.sspectra.com/sopra.html
15. O. AMBACHER, M. ARZBERGER, D. BRUNNER, H. ANGERER, F. FREUDENBERG, N. ESSER, T. WETHKAMP, K. WILMERS, W. RICHTER, and M. STUTZMANN, MRS Internet J. Nitride Semicond. Res. 2, 22 (1997).
16. S. SHOKHOVETS, R. GOLDHAHN, V. CIMALLA, T. S. CHENG, and C. T. FOXON, J. Appl. Phys. 84, 1561 (1998).
17. R. KÖHLER, G. SUCHANECK, P. PADMINI, T. SANDNER, G. GERLACH, and G. HOFFMANN, Ferroelectrics 225, 57 (1999).
18. H. SCHER and E. W. MONTROLL, Phys. Rev. B 12, 2455 (1975).