메뉴 건너뛰기




Volumn 39, Issue 5, 2004, Pages 1615-1620

In-situ atomic force microscopic study of reverse pulse plated Cu/Co-Ni-Cu films

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CYCLIC VOLTAMMETRY; ELECTROCHEMISTRY; ELECTRODEPOSITION; ELECTRODES; MORPHOLOGY; SURFACE ROUGHNESS; SYNTHESIS (CHEMICAL); X RAY DIFFRACTION ANALYSIS;

EID: 1842588340     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/B:JMSC.0000016160.97771.44     Document Type: Article
Times cited : (8)

References (29)
  • 20
    • 1842443025 scopus 로고    scopus 로고
    • DHIRENDRA GUPTA, A. NAYAK, D. KOUSIK, S. K. KULKARNI and R. K. PANDEY (to be published).
    • DHIRENDRA GUPTA, A. NAYAK, D. KOUSIK, S. K. KULKARNI and R. K. PANDEY (to be published).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.