Analysis of interfacial water at a hydrophilic silicon surface by in-situ FTIR/internal reflection spectroscopy

Langmuir

Volumn 12, Issue 17, 1996, Pages 4176-4184

  Yalamanchili, M R ^a,b   Atia, A A ^a   Miller, J D ^a  

^a UNIVERSITY OF UTAH   (United States)

^b MEMC Electronic Materials Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001272667     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la950340b     Document Type: Article

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