A unique determination of boundary condition in quantitative electron diffraction: Application to accurate measurements of mean inner potentials

Ultramicroscopy

Volumn 98, Issue 2-4, 2004, Pages 135-143

  Wu, L ^a   Schofield, M A ^a   Zhu, Y ^a   Tafto, J ^b  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF OSLO   (Norway)

Author keywords

003,007; 61.14.Lj; 61.14.Nm; 68.37.Lp; 74.70.Ad; Convergent beam electron diffraction; Electron holography; Magnesium diboride; Mean inner potential

Indexed keywords

BOUNDARY CONDITIONS; ELECTRON BEAMS; ELECTRON HOLOGRAPHY; ELECTROSTATICS; MAGNESIUM COMPOUNDS; SILICON; SUPERCONDUCTING MATERIALS;

DIFFRACTION INTENSITY; ELECTRON SHADOW IMAGING;

ELECTRON DIFFRACTION;

BORON DERIVATIVE; MAGNESIUM DERIVATIVE; SILICON;

ARTICLE; ELECTRIC POTENTIAL; ELECTRON DIFFRACTION; HOLOGRAPHY; IMAGING; MEASUREMENT; QUANTITATIVE ANALYSIS; SUPERCONDUCTOR;

EID: 1842577734     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2003.08.006     Document Type: Article

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