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Volumn 18, Issue 3, 2004, Pages 289-316

Study of structure changes on the Si surfaces using reflection high-energy electron diffraction

Author keywords

Phase transition; Reflection high energy electron diffraction (RHEED); Silicon surface; Thermal diffuse scattering

Indexed keywords

SILICON;

EID: 1842473692     PISSN: 02179792     EISSN: None     Source Type: Journal    
DOI: 10.1142/S021797920402388X     Document Type: Review
Times cited : (4)

References (60)
  • 8
    • 41949093652 scopus 로고
    • A. Ichimiya, Jpn. J. Appl. Phys. 22, 176 (1983); 24, 1365 (1985).
    • (1985) Jpn. J. Appl. Phys. , vol.24 , pp. 1365
  • 17
    • 0031520889 scopus 로고    scopus 로고
    • K. Yamaguchi, H. Mitsui and Y. Shigeta, J. Vac. Sci. Technol. A15, 2569 (1997); A17, 3530 (1999).
    • (1999) J. Vac. Sci. Technol. , vol.A17 , pp. 3530
  • 38
    • 0004436924 scopus 로고
    • Eds. C. H. Macgllavry and G. D. Rieck (Kynoch Press, Birmingham)
    • International Tables for X-ray Crystallography, Vol. III, Eds. C. H. Macgllavry and G. D. Rieck (Kynoch Press, Birmingham, 1973), p. 234.
    • (1973) International Tables for X-ray Crystallography , vol.3 , pp. 234
  • 51
    • 23544434557 scopus 로고
    • U. Höfer et al., Phys. Rev. B52, 5264 (1995).
    • (1995) Phys. Rev. , vol.B52 , pp. 5264
    • Höfer, U.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.