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Volumn 18, Issue 3, 2004, Pages 289-316
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Study of structure changes on the Si surfaces using reflection high-energy electron diffraction
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Author keywords
Phase transition; Reflection high energy electron diffraction (RHEED); Silicon surface; Thermal diffuse scattering
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Indexed keywords
SILICON;
CALCULATION;
CRYSTAL STRUCTURE;
DIFFUSION;
ELECTRON DIFFRACTION;
FILM;
MAGNETISM;
MELTING POINT;
PHASE TRANSITION;
REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;
REVIEW;
SEGREGATION ANALYSIS;
STRUCTURE ANALYSIS;
SURFACE PROPERTY;
TEMPERATURE DEPENDENCE;
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EID: 1842473692
PISSN: 02179792
EISSN: None
Source Type: Journal
DOI: 10.1142/S021797920402388X Document Type: Review |
Times cited : (4)
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References (60)
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