X-ray standing waves imaging

Surface Science

Volumn 554, Issue 2-3, 2004, Pages 77-79

  Zegenhagen, Jörg ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

Surface structure, morphology, roughness, and topography; X ray standing waves

Indexed keywords

CRYSTALS; FLUORESCENCE; FOURIER TRANSFORMS; MATERIALS SCIENCE; MORPHOLOGY; SCANNING TUNNELING MICROSCOPY; SURFACE ROUGHNESS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS; X RAYS;

SURFACE STRUCTURE, MORPHOLOGY, ROUGHNESS, AND TOPOGRAPHY; X-RAY FLUORESCENCE; X-RAY STANDING WAVES (XSW);

IMAGING TECHNIQUES;

EID: 1842453764     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2003.12.057     Document Type: Short Survey

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