SCOPUS 정보 검색 플랫폼

Surface Science

Volumn 482-485, Issue PART 1, 2001, Pages 391-395

Origin of roughening in epitaxial growth of silicon on Si(0 0 1) and Ge(0 0 1) surfaces

(4) Zandvliet, H J W a Zoethout, E a Wulfhekel, W b Poelsema, Bene a

a UNIVERSITY OF TWENTE (Netherlands)

b MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS (Germany)

Author keywords

Epitaxy; Germanium; Scanning tunneling microscopy; Silicon; Surface diffusion

Indexed keywords

ANISOTROPY; DIFFUSION IN SOLIDS; EPITAXIAL GROWTH; NUCLEATION; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING GERMANIUM; SURFACE ROUGHNESS; SURFACE TREATMENT;

ANTIPHASE BOUNDARY; SURFACE RECONSTRUCTION;

SEMICONDUCTING SILICON;

EID: 18244431808 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(01)00807-X Document Type: Conference Paper

Times cited : (9)

References (19)

1
- 36849110552
- (1966) J. Chem. Phys. , vol.44 , pp. 1039
- Ehrlich, G.¹ Hudda, F.G.²

2
- 36749047341
- (1966) J. Appl. Phys. , vol.37 , pp. 3682
- Schwoebel, R.L.¹ Shipsey, E.J.²

3
- 0001247082
- (1998) Phys. Rev. B , vol.57 , pp. 6803
- Zandvliet, H.J.W.¹ Swartzentruber, B.S.² Wulfhekel, W.³ Hattink, B.J.⁴ Poelsema, B.⁵

4
- 27844561258
- (1990) J. Vac. Sci. Technol. A , vol.8 , pp. 195
- Hamers, R.J.¹ Köhler, K.² Demuth, J.E.³

5
- 3342925848
- (1993) Phys. Rev. Lett. , vol.70 , pp. 2589
- Bedrossian, P.¹ Kaxiras, E.²

6
- 11944255842
- (1990) Phys. Rev. Lett. , vol.65 , pp. 1913
- Swartzentruber, B.S.¹ Mo, Y.-W.² Kariotis, R.³ Lagally, M.G.⁴ Webb, M.B.⁵

7
- 0001108216
- (1992) Phys. Rev. B , vol.45 , pp. 5965
- Zandvliet, H.J.W.¹ Elswijk, H.B.² Van Loenen, E.J.³ Dijkkamp, D.⁴

8
- 0034341834
- (2000) Rev. Mod. Phys. , vol.72 , pp. 593
- Zandvliet, H.J.W.¹

9
- 35949011121
- (1989) Phys. Rev. Lett. , vol.63 , pp. 2393
- Mo, Y.-W.¹

10
- 0004712077
- (1991) Surf. Sci. , vol.255 , pp. 218
- Swihêch, W.¹ Bauer, E.²

11
- 0000904494
- (1994) Phys. Rev. Lett. , vol.73 , pp. 1656
- Bartelt, N.C.¹ Tromp, R.M.² Williams, E.D.³

12
- 0004730041
- (1998) Phys. Rev. B , vol.58 , pp. 15359
- Wulfhekel, W.¹ Zandvliet, H.J.W.² Hattink, B.-J.³ Rosenfeld, G.⁴ Comsa, G.⁵ Poelsema, B.⁶

13
- 0001951949
- A. Yoshinori, T. Shinjo, H. Watanabe (Eds.), Springer, Berlin
- (1992) Ordering at Surfaces and Interfaces , pp. 85
- Dijkkamp, D.¹ Van Loenen, E.J.² Elswijk, H.B.³

14
- 3342985165
- (1996) Phys. Rev. Lett. , vol.76 , pp. 459
- Swartzentruber, B.S.¹

15
- 0000742769
- (1991) Phys. Rev. Lett. , vol.66 , pp. 1729
- Brocks, G.¹ Kelly, P.J.²

16
- 4043096484
- (1996) Phys. Rev. Lett. , vol.76 , pp. 2362
- Brocks, G.¹ Kelly, P.J.²

17
- 6944246313
- (1997) Phys. Rev. Lett. , vol.78 , pp. 4229
- Borosvky, B.¹ Krueger, M.² Ganz, E.³

18
- 0343005952
- (2000) Surf. Sci. , vol.452 , pp. 247
- Zoethout, E.¹ Gurlu, O.² Zandvliet, H.J.W.³ Poelsema, B.⁴

19
- 0003589389
- World Scientific, Singapore
- (2000) Silicon Surfaces and Formation of Interfaces
- Dabrowski, J.¹ Müssig, H.-J.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.