Structural damage identification for thin plates using smart piezoelectric transducers

Computer Methods in Applied Mechanics and Engineering

Volumn 194, Issue 27-29, 2005, Pages 3192-3209

  Tseng, Kevin K ^a   Wang, Liangsheng ^a  

^a VANDERBILT UNIVERSITY   (United States)

Author keywords

Damage identification; Finite element analysis; Impedance; Piezoelectricity; Structural dynamics

Indexed keywords

DEFECTS; ELECTRIC ADMITTANCE; MATHEMATICAL MODELS; OPTIMIZATION; PERTURBATION TECHNIQUES; PIEZOELECTRIC TRANSDUCERS; PLATES (STRUCTURAL COMPONENTS); PROBLEM SOLVING;

DAMAGE PARAMETERS; ELECTRIC IMPEDANCE MODEL; NONLINEAR OPTIMIZATION PROBLEMS; STRUCTURAL DAMAGES;

FINITE ELEMENT METHOD;

FINITE ELEMENT ANALYSIS; PIEZOELECTRICITY;

EID: 18144430605     PISSN: 00457825     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cma.2004.08.007     Document Type: Article

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