Temperature dependency of impedance-based nondestructive testing

Experimental Techniques

Volumn 27, Issue 5, 2003, Pages 33-36

  Tseng, K K ^a   Tinker, M L ^b   Lassiter, J O ^b   Peairs, D M ^c  

^a VANDERBILT UNIVERSITY   (United States)

^b NASA MARSHALL SPACE FLIGHT CENTER   (United States)

^c State University   (United States)

Author keywords

Impedance; NDE; NDT; Piezoceramics; PZT; Smart Material

Indexed keywords

ACTUATORS; CRYOGENICS; INDUSTRIAL APPLICATIONS; LAMINATES; PIEZOELECTRIC MATERIALS; SENSORS; THERMAL EFFECTS;

DAMAGE IDENTIFICATION; PIEZOCERAMIC MATERIALS; TEMPERATURE DEPENDENSY;

NONDESTRUCTIVE EXAMINATION;

EID: 0142027802     PISSN: 07328818     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1747-1567.2003.tb00127.x     Document Type: Article

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