Event-driven simulation and modeling of phase noise of an RF oscillator

IEEE Transactions on Circuits and Systems I: Regular Papers

Volumn 52, Issue 4, 2005, Pages 723-733

  Staszewski, Robert Bogdan ^a   Fernando, Chan ^a   Balsara, Poras T ^b  

^a TEXAS INSTRUMENTS   (United States)

^b UNIVERSITY OF TEXAS AT DALLAS   (United States)

Author keywords

Bluetooth; Event driven; Jitter; Modeling; Oscillator; Phase noise; Simulation; System on chip (SoC); VHDL; Wireless

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; INTEGRATED CIRCUIT MANUFACTURE; JITTER; MATHEMATICAL MODELS; PHASE LOCKED LOOPS; SPURIOUS SIGNAL NOISE; TIME DOMAIN ANALYSIS; TRANSCEIVERS;

BLUETOOTH TRANSCEIVER; EVENT DRIVEN SIMULATION; PHASE NOISE; SYSTEM ON CHIP (SOC);

OSCILLATORS (ELECTRONIC);

EID: 18144411685     PISSN: 10577122     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCSI.2005.844236     Document Type: Article

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