Jitter models and measurement methods for high-speed serial interconnects

Proceedings - International Test Conference

Volumn , Issue , 2004, Pages 1295-1302

  Kuo, Andy ^a   Farahmand, Touraj ^a   Ou, Nelson ^a   Tabatabaei, Sassan ^b   Ivanov, André ^a  

^a UNIVERSITY OF BRITISH COLUMBIA   (Canada)

^b Guide Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDED UNCORRELATED JITTER (BUJ); GAUSSIAN DISTRIBUTION; JITTER MEASUREMENT; RANDOM NOISE;

ALGORITHMS; BIT ERROR RATE; CROSSTALK; DATA TRANSFER; JITTER; MATHEMATICAL MODELS; PROBABILITY DENSITY FUNCTION; RANDOM PROCESSES; SIGNAL RECEIVERS; THERMAL NOISE; TRANSMITTERS;

INTERCONNECTION NETWORKS;

EID: 18144373847     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)

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