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Journal of Electronic Materials

Volumn 34, Issue 4, 2005, Pages 389-394

Properties of electrical contacts on bulk and epitaxial n-type ZnO

(5) Murphy, T E a Blaszczak, J O a Moazzami, K a Bowen, W E a Phillips, J D a

a The Department of Civil and Environmental Engineering (United States)

Author keywords

Ohmic contact; Schottky contact; ZnO

Indexed keywords

CHARACTERIZATION; ELECTRIC BREAKDOWN; ELECTRIC PROPERTIES; MOLECULAR BEAM EPITAXY; PULSED LASER DEPOSITION; THIN FILMS; ULTRAVIOLET DETECTORS; ZINC OXIDE;

DEEP-LEVEL TRANSIENT SPECTROSCOPY; PLASMA SURFACE TREATMENT; SCHOTTKY CONTACTS; TRANSMISSION LINE METHOD (TLM);

OHMIC CONTACTS;

EID: 18144373487 PISSN: 03615235 EISSN: None Source Type: Journal
DOI: 10.1007/s11664-005-0116-3 Document Type: Conference Paper

Times cited : (21)

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