Localized attack of a two-phase metal, scanning electrochemical microscopy studies of NiCrMoGd alloys

Journal of Electroanalytical Chemistry

Volumn 579, Issue 2, 2005, Pages 291-298

  Lister, T E ^a   Pinhero, P J ^a   Trowbridge, T L ^a   Mizia, R E ^a  

^a IDAHO NATIONAL LABORATORY   (United States)

Author keywords

Conducting AFM; Corrosion; Neutron absorber; Nickel alloy; SECM

Indexed keywords

CHEMICAL ATTACK; CORROSION; DISSOLUTION; MICROSCOPIC EXAMINATION; NEUTRON ABSORPTION; NICKEL ALLOYS; RADIOACTIVE WASTE STORAGE;

CONDUCTING AFM; NEUTRON ABSORBERS; SCANNING ELECTROCHEMICAL MICROSCOPY; TWO PHASE METALS;

ELECTROCHEMISTRY;

EID: 18144368125     PISSN: 15726657     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jelechem.2005.02.019     Document Type: Article

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