Study of the ferroelectricity in Bi2Ti2O7 by infrared spectroscopic ellipsometry

Applied Physics Letters

Volumn 86, Issue 11, 2005, Pages 1-3

  Hou, Yun ^a   Huang, Zhiming ^a   Xue, Jianqiang ^a   Wu, Yunian ^a   Shen, Xuemin ^a   Chu, Junhao ^a  

^a SHANGHAI INSTITUTE OF TECHNICAL PHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLIZATION; DIELECTRIC PROPERTIES OF SOLIDS; ELLIPSOMETRY; FERROELECTRIC THIN FILMS; FERROELECTRICITY; HYSTERESIS; INFRARED SPECTROSCOPY; PERMITTIVITY; PHASE TRANSITIONS; POLARIZATION; X RAY DIFFRACTION;

DIELECTRIC FUNCTIONS; INFRARED SPECTROSCOPIC ELLIPSOMETRY; PHONON FREQUENCIES; STRUCTURAL DISTORTION;

BISMUTH COMPOUNDS;

EID: 17944380649     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1875755     Document Type: Article

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