SCOPUS 정보 검색 플랫폼

Accreditation and Quality Assurance

Volumn 10, Issue 4, 2005, Pages 144-148

Is odd-even effect reflected in detection limits?

(2) Verma, Surendra P a Santoyo, E a

a INSTITUTO DE ENERGÍAS RENOVABLES (Mexico)

Author keywords

Detection limit; ICP MS; Sensitivity; Trace elements

Indexed keywords

ELEMENT;

ANALYTIC METHOD; ARTICLE; ENVIRONMENTAL FACTOR; EVALUATION; GEOLOGY; MATHEMATICAL ANALYSIS; MATHEMATICAL PARAMETERS; MEASUREMENT; PHYSICAL CHEMISTRY; QUALITY CONTROL;

EID: 17844388899 PISSN: 09491775 EISSN: None Source Type: Journal
DOI: 10.1007/s00769-005-0906-6 Document Type: Article

Times cited : (22)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.