Artificial neural network analysis of RBS data of Er-implanted sapphire

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 175-177, Issue , 2001, Pages 108-112

  Barradas, N P ^a,b   Vieira, A ^a,c   Alves, E ^a,b  

^a INSTITUTO TECNOLÓGICO E NUCLEAR   (Portugal)

^b CENTRO DE FÍSICA NUCLEAR DA UNIVERSIDADE DE LISBOA   (Portugal)

^c INSTITUTO SUPERIOR DE ENGENHARIA DO PORTO   (Portugal)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; BACKPROPAGATION; ERBIUM; ION IMPLANTATION; NEURAL NETWORKS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SPECTROMETRY; SURFACE STRUCTURE;

ELEMENTAL DEPTH PROFILING; RUTHERFORD BACKSCATTERING SPECTROMETRY (RBS);

SAPPHIRE;

EID: 17744415859     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(00)00548-6     Document Type: Conference Paper

References (16)