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Volumn , Issue , 2004, Pages 563-567

Influence of electrode area on dielectric breakdown strength of thin poly(ethylene terephthalate) films

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; DIELECTRIC LOSSES; ELECTRIC FIELDS; ELECTRIC INSULATION; ELECTRIC POTENTIAL; ELECTRODES; PARTIAL DISCHARGES; POLYETHYLENE TEREPHTHALATES; THIN FILMS; WEIBULL DISTRIBUTION;

EID: 17744389267     PISSN: 00849162     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (10)

References (8)
  • 1
    • 17744362011 scopus 로고    scopus 로고
    • Datasheet from ABB Ltd.
    • Datasheet from ABB Ltd.: www.abb.com/Products/High Voltage products/Capacitors.
  • 7
    • 84987266075 scopus 로고
    • A statistical distribution function of wide applicability
    • Sept.
    • W. Weibull, "A Statistical Distribution Function of Wide Applicability", J. Appl. Mech., vol. 18, pp. 293-297, Sept. 1951.
    • (1951) J. Appl. Mech. , vol.18 , pp. 293-297
    • Weibull, W.1
  • 8
    • 0025442738 scopus 로고
    • Estimating the cumulative probability of failure data points to be plotted on weibull and other probability paper
    • I. C. Fothergill, "Estimating the Cumulative Probability of Failure Data Points to be Plotted on Weibull and Other Probability Paper", IEEE Trans. Elec. Insul., vol. 25, no. 3, pp. 489-492, 1990.
    • (1990) IEEE Trans. Elec. Insul. , vol.25 , Issue.3 , pp. 489-492
    • Fothergill, I.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.