On the statistical testing of solid dielectrics

IEEE International Conference on Conduction & Breakdown in Solid Dielectrics

Volumn , Issue , 1998, Pages 514-518

  Morcos, M M ^a   Srivastava, K D ^a  

^a KANSAS STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC BREAKDOWN OF SOLIDS; FUNCTIONS; PROBABILITY; SERVICE LIFE; STATISTICAL TESTS; WEIBULL DISTRIBUTION;

INSULATION STRENGTH;

ELECTRIC INSULATORS;

EID: 0032301102     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (30)