Real-time X-ray study of roughness scaling in the initial growth of epitaxial BaTiO3/LaNiO3 superlattices

Journal of Crystal Growth

Volumn 279, Issue 1-2, 2005, Pages 114-121

  Liang, Yuan Chang ^a   Lee, Hsin Yi ^b   Liu, Heng Jui ^b   Huang, Chun Kai ^a   Wu, Tai Bor ^a  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^b NATIONAL SYNCHROTRON RADIATION RESEARCH CENTER   (Taiwan)

Author keywords

A1. Surface structure; A1. X ray diffraction; A3. Superlattices

Indexed keywords

CRYSTAL STRUCTURE; REAL TIME SYSTEMS; RELAXATION PROCESSES; SUPERLATTICES; SURFACE ROUGHNESS; SURFACE STRUCTURE; SYNCHROTRON RADIATION; X RAY DIFFRACTION;

KINETIC EFFECTS; LATTICE RELAXATION; SUPERLATTICE STRUCTURE; X-RAY REFLECTIVITY;

EPITAXIAL GROWTH;

EID: 17744388778     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2005.02.047     Document Type: Article

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