High-resolution transmission electron microscopy investigation of nanostructures in SnO2 thin films prepared by pulsed laser deposition

Journal of Solid State Chemistry

Volumn 178, Issue 3, 2005, Pages 892-896

  Chen, Z W ^a   Lai, J K L ^a   Shek, C H ^a  

^a CITY UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

Microstructure; Nanocrystallite; Pulsed laser deposition; SnO2 thin film

Indexed keywords

GLASS; GRAIN GROWTH; MICROSTRUCTURE; OPTICAL RESOLVING POWER; POLYCRYSTALLINE MATERIALS; PULSED LASER DEPOSITION; SUBSTRATES; THIN FILMS; TIN COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

EDGE DISLOCATION; NANOCRYSTALLITE; PARTICLE GROWTH; ROOM TEMPERATURE;

NANOSTRUCTURED MATERIALS;

TIN DERIVATIVE;

ARTICLE; CHEMICAL STRUCTURE; CRYSTAL STRUCTURE; FILM; GAS ANALYSIS; LASER; NANOTECHNOLOGY; PRESSURE; ROOM TEMPERATURE; STRUCTURE ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

EID: 17744371851     PISSN: 00224596     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jssc.2005.01.013     Document Type: Article

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