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Volumn 443-444, Issue , 2004, Pages 1-8

Grain Surface Relaxation and Grain Interaction in Powder Diffraction

Author keywords

Grain Interaction; Grain Surface Relaxation; Nanocrystals; Residual Stress; XRD

Indexed keywords

AMORPHOUS FILMS; FILM GROWTH; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; INTEGRATION; INTERFACES (MATERIALS); MICROSTRUCTURE; PHYSICAL VAPOR DEPOSITION; POLYCRYSTALLINE MATERIALS; RESIDUAL STRESSES; SURFACE PHENOMENA; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; VECTORS; X RAY CRYSTALLOGRAPHY; X RAY POWDER DIFFRACTION;

EID: 17644440874     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: None     Document Type: Conference Paper
Times cited : (10)

References (20)
  • 13
    • 0003472812 scopus 로고
    • st edition (1969), Reading, Mass.: Addison Wesley)
    • st edition (1969), Reading, Mass.: Addison Wesley)
    • (1990) nd Edition
    • Warren, B.E.1
  • 16
    • 0004326059 scopus 로고
    • Oxford: Oxford University Press
    • Young R.A., (editor), The Rietveld Method, (1993) Oxford: Oxford University Press.
    • (1993) The Rietveld Method
    • Young, R.A.1
  • 18
    • 0842281471 scopus 로고    scopus 로고
    • JCPDS card #34-0394
    • JCPDS card #34-0394


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.