A characterization of diagnosability conditions for variance components analysis in assembly operations

IEEE Transactions on Automation Science and Engineering

Volumn 2, Issue 2, 2005, Pages 101-110

  Apley, Daniel W ^a   Ding, Yu ^b  

^a Northwestern University   (United States)

^b Texas AandM University   (United States)

Author keywords

Assembly systems; Fault diagnosis; Manufacturing variation reduction; Sensor layout; Variance component estimation

Indexed keywords

ALGORITHMS; AUTOMATION; ESTIMATION; LASER OPTICS; MATHEMATICAL MODELS; OPERATIONS RESEARCH; PROCESS CONTROL; STATISTICAL METHODS;

ASSEMBLY SYSTEMS; FAULT DIAGNOSIS; MANUFACTURING VARIATION REDUCTION; SENSOR LAYOUT; VARIANCE COMPONENT ESTIMATION;

ASSEMBLY;

EID: 17644407729     PISSN: 15455955     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASE.2005.844436     Document Type: Article

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