Comparative analysis of basic transport properties in the inversion layer of Bulk and SOI MOSFETs: A Monte-Carlo study

ESSCIRC 2004 - Proceedings of the 34th European Solid-State Device Research Conference

Volumn , Issue , 2004, Pages 321-324

  Lucci, Luca ^a   Esseni, David ^a   Palestri, Pierpaolo ^a   Selmi, Luca ^a  

^a UNIVERSITY OF UDINE   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL COMPLEXITY; COSINE TRANSFORMS; MONTE CARLO METHODS; PROBLEM SOLVING; SILICON ON INSULATOR TECHNOLOGY; SURFACE ROUGHNESS; THIN FILMS; VECTORS;

BOLTZMANN TRANSPORT EQUATION (BTE); CARRIER SCATTERING; ELLIPTIC DISPERSION; WAVE-FUNCTIONS;

MOSFET DEVICES;

EID: 17644370378     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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