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Volumn 76, Issue 4, 2005, Pages

Compact extreme ultraviolet reflectometer for the characterization of grazing incidence optics based on a gas discharge light source

Author keywords

[No Author keywords available]

Indexed keywords

GRAZING INCIDENCE; PLASMA LIGHT SOURCE; ULTRAVIOLET REFLECTOMETERS;

EID: 17644368536     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1884387     Document Type: Article
Times cited : (12)

References (11)
  • 1
    • 17644388281 scopus 로고    scopus 로고
    • Proceedings of SPIE Vol. R. ScottMackay (Photonics
    • Emerging Lithographic Technologies VIII, Proceedings of SPIE Vol. 5374, edited by, R. Scott Mackay, (Photonics, 2004).
    • (2004) Emerging Lithographic Technologies VIII , vol.5374
  • 2
    • 17644369088 scopus 로고    scopus 로고
    • Proceedings of the Second International EUVL Symposium, Antwerp, Belgium, 27 September-2 October
    • Proceedings of the Second International EUVL Symposium, Antwerp, Belgium, 27 September-2 October 2003, http:www.sematech. orgresourceslithomeetingseuvl20030930index.htm.
    • (2003)
  • 9
    • 0004932883 scopus 로고    scopus 로고
    • B. L. Henke, E. M. Gullikson, and J. C. Davis, At. Data Nucl. Data Tables 54, 181 (1993); and Data from Center for X-Ray Optics, Berkeley, California (http:www-cxro.lbl.govoptical_constants).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.