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Volumn 370, Issue 1, 2000, Pages 315-320
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Stress development in FeAl8 thin films during heat treatment
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
CRYSTAL MICROSTRUCTURE;
GRAIN BOUNDARIES;
GRAIN GROWTH;
GRAIN SIZE AND SHAPE;
IRON ALLOYS;
RESIDUAL STRESSES;
STRESS RELAXATION;
TEXTURES;
THERMODYNAMIC STABILITY;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION ANALYSIS;
BIAXIAL STRESS;
EXCESS VACANCY ANNIHILATION;
GRAIN BOUNDARY RELAXATION;
STRESS MEASUREMENT;
THIN FILMS;
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EID: 17544399348
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(00)00857-9 Document Type: Article |
Times cited : (10)
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References (18)
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