Characterization of the glass transition in vitreous silica by temperature scanning small-angle X-ray scattering

Europhysics Letters

Volumn 70, Issue 2, 2005, Pages 211-217

  Bruning R ^a   Levelut, C ^b   Faivre, A ^b   LeParc, R ^b   Simon, J P ^c   Bley, F ^c   Hazemann, J L ^d  

^a MOUNT ALLISON UNIVERSITY   (Canada)

^b UNIVERSITÉ MONTPELLIER 2   (France)

^c UNIV GRENOBLE ALPES   (France)

^d LABORATOIRE DE CRISTALLOGRAPHIE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 17544375241     PISSN: 02955075     EISSN: None     Source Type: Journal    
DOI: 10.1209/epl/i2004-10481-1     Document Type: Article

References (19)

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