Temperature dependence of the density fluctuations of silica by small-angle X-ray scattering

Philosophical Magazine B: Physics of Condensed Matter; Statistical Mechanics, Electronic, Optical and Magnetic Properties

Volumn 82, Issue 4, 2002, Pages 431-438

  Le Parc, R ^a   Champagnon, B ^a   David, L ^b   Faivre, A ^c   Levelut, C ^c   Guenot, Ph ^d   Hazemann, J L ^e   Rochas, C ^f   Simon, J P ^g  

^a UNIVERSITÉ LYON 1   (France)

^b CNRS   (France)

^c UNIV MONTPELLIER   (France)

^d NOKIA RESEARCH CENTER   (United States)

^e LABORATOIRE DE CRISTALLOGRAPHIE   (France)

^f EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^g GRENOBLE INSTITUTE OF TECHNOLOGY   (France)

Author keywords

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Indexed keywords

EID: 0037051449     PISSN: 13642812     EISSN: None     Source Type: Journal    
DOI: 10.1080/13642810110O84605     Document Type: Article

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