-
2
-
-
0003499034
-
-
edited by R. K. Chang and A. J. Campillo (World Scientific, Singapore)
-
Optical Processes in Microcavities, edited by R. K. Chang and A. J. Campillo (World Scientific, Singapore, 1996).
-
(1996)
Optical Processes in Microcavities
-
-
-
5
-
-
0033546064
-
-
O. Painter, R. K. Lee, A. Yariv, A. Scherer, J. D. O'Brien, P. D. Dapkus, and I. Kim, Science 284, 1819 (1999).
-
(1999)
Science
, vol.284
, pp. 1819
-
-
Painter, O.1
Lee, R.K.2
Yariv, A.3
Scherer, A.4
O'Brien, J.D.5
Dapkus, P.D.6
Kim, I.7
-
6
-
-
0030725654
-
-
J. S. Foresi, P. R. Villeneuve, J. Ferrera, E. R. Thoen, G. Steinmeyer, S. Fan, J. D. Joannopoulos, L. C. Kimerling, H. I. Smith, and E. P. Ippen, Nature (London) 390, 143 (1997).
-
(1997)
Nature (London)
, vol.390
, pp. 143
-
-
Foresi, J.S.1
Villeneuve, P.R.2
Ferrera, J.3
Thoen, E.R.4
Steinmeyer, G.5
Fan, S.6
Joannopoulos, J.D.7
Kimerling, L.C.8
Smith, H.I.9
Ippen, E.P.10
-
7
-
-
79956015441
-
-
H.-Y. Ryu, S.-H. Kim, H.-G. Park, J.-K. Hwang, Y.-H. Lee, and J.-S. Kim, Appl. Phys. Lett. 80, 3883 (2002).
-
(2002)
Appl. Phys. Lett.
, vol.80
, pp. 3883
-
-
Ryu, H.-Y.1
Kim, S.-H.2
Park, H.-G.3
Hwang, J.-K.4
Lee, Y.-H.5
Kim, J.-S.6
-
10
-
-
0035848237
-
-
C. Smith, R. De la Rue, M. Rattier, S. Olivier, H. Benisty, C. Weisbuch, T. Krauss, U. Oesterlé, and R. Houdré, Appl. Phys. Lett. 78, 1487 (2001).
-
(2001)
Appl. Phys. Lett.
, vol.78
, pp. 1487
-
-
Smith, C.1
De La Rue, R.2
Rattier, M.3
Olivier, S.4
Benisty, H.5
Weisbuch, C.6
Krauss, T.7
Oesterlé, U.8
Houdré, R.9
-
12
-
-
0035506428
-
-
O. Painter, K. Srinivasan, J. D. O'Brien, A. Scherer, and P. D. Dapkus, J. Opt. A, Pure Appl. Opt. 3, S161 (2001).
-
(2001)
J. Opt. A, Pure Appl. Opt.
, vol.3
-
-
Painter, O.1
Srinivasan, K.2
O'Brien, J.D.3
Scherer, A.4
Dapkus, P.D.5
-
13
-
-
0035945111
-
-
T. Yoshie, J. Vučković, A. Scherer, H. Chen, and D. Deppe, Appl. Phys. Lett. 79, 4289 (2001).
-
(2001)
Appl. Phys. Lett.
, vol.79
, pp. 4289
-
-
Yoshie, T.1
Vučković, J.2
Scherer, A.3
Chen, H.4
Deppe, D.5
-
14
-
-
0141921312
-
-
K. Srinivasan, P. E. Barclay, O. Painter, J. Chen, A. Y. Cho, and C. Gmachl, Appl. Phys. Lett. 83, 1915 (2003).
-
(2003)
Appl. Phys. Lett.
, vol.83
, pp. 1915
-
-
Srinivasan, K.1
Barclay, P.E.2
Painter, O.3
Chen, J.4
Cho, A.Y.5
Gmachl, C.6
-
15
-
-
0242499516
-
-
Y. Akahane, T. Asano, B.-S. Song, and S. Noda, Nature (London) 425, 944 (2003).
-
(2003)
Nature (London)
, vol.425
, pp. 944
-
-
Akahane, Y.1
Asano, T.2
Song, B.-S.3
Noda, S.4
-
16
-
-
0001034528
-
-
J. Knight, G. Cheung, F. Jacques, and T. Birks, Opt. Lett. 22, 1129 (1997).
-
(1997)
Opt. Lett.
, vol.22
, pp. 1129
-
-
Knight, J.1
Cheung, G.2
Jacques, F.3
Birks, T.4
-
18
-
-
0003716166
-
-
Princeton University Press, Princeton, NJ
-
J. D. Joannopoulos, R. D. Meade, and J. N. Winn, Photonic Crystals (Princeton University Press, Princeton, NJ, 1995).
-
(1995)
Photonic Crystals
-
-
Joannopoulos, J.D.1
Meade, R.D.2
Winn, J.N.3
-
19
-
-
84975589625
-
-
J. Knight, N. Dubreuil, V. Sandoghdar, J. Hare, V. Lefèvre-Seguin, J. M. Raimond, and S. Haroche, Opt. Lett. 20, 1515 (1995).
-
(1995)
Opt. Lett.
, vol.20
, pp. 1515
-
-
Knight, J.1
Dubreuil, N.2
Sandoghdar, V.3
Hare, J.4
Lefèvre-Seguin, V.5
Raimond, J.M.6
Haroche, S.7
-
20
-
-
5444219712
-
-
note
-
Here the same optical fiber taper near-field probe is used to both excite the PC cavity modes and to map their spatial profile. Other works employing evanescent coupling from eroded mono-mode fibers to excite silica microsphere whispering-gallery modes have used a secondary fiber tip to collect and map the mode profiles (Ref. 19).
-
-
-
-
21
-
-
5444220974
-
-
note
-
The maximum transmission depth achieved for the mode of interest was ∼ 10%, though coupling to other modes reached depths as large as ∼30%. Coupling in all cases was limited to the under-coupled regime (Ref. 28).
-
-
-
-
23
-
-
0001325436
-
-
B. Gayral, J. M. Gérard, A. Lemaître, C. Dupuis, L. Manin, and J. L. Pelouard, Appl. Phys. Lett. 75, 1908 (1999).
-
(1999)
Appl. Phys. Lett.
, vol.75
, pp. 1908
-
-
Gayral, B.1
Gérard, J.M.2
Lemaître, A.3
Dupuis, C.4
Manin, L.5
Pelouard, J.L.6
-
25
-
-
85088489951
-
-
note
-
eff is defined relative to peak electric field energy density, rather than electric field strength, a factor η must be included for dielectric cavities where the two values are not equal. η∼0.42 for our cavity.
-
-
-
-
26
-
-
5444256551
-
-
B. Lev, K. Srinivasan, P. E. Barclay, O. Painter, and H. Mabuchi, Nanotechnology 15, S556 (2004).
-
(2004)
Nanotechnology
, vol.15
-
-
Lev, B.1
Srinivasan, K.2
Barclay, P.E.3
Painter, O.4
Mabuchi, H.5
-
27
-
-
4644325997
-
-
C. Becher, A. Kiraz, P. Michler, A. Imamoǧlu, W. V. Schoenfeld, P M. Petroff, L. Zhang, and E. Hu, Phys. Rev. B 63, 121312 (2001).
-
(2001)
Phys. Rev. B
, vol.63
, pp. 121312
-
-
Becher, C.1
Kiraz, A.2
Michler, P.3
Imamoǧlu, A.4
Schoenfeld, W.V.5
Petroff, P.M.6
Zhang, L.7
Hu, E.8
-
29
-
-
0037468209
-
-
D. K. Armani, T. J. Kippenberg, S. M. Spillane, and K. J. Vahala, Nature (London) 421, 925 (2003).
-
(2003)
Nature (London)
, vol.421
, pp. 925
-
-
Armani, D.K.1
Kippenberg, T.J.2
Spillane, S.M.3
Vahala, K.J.4
|