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Volumn 13, Issue 3, 2005, Pages 195-200

Surface passivation by rehydrogenation of silicon-nitride-coated silicon wafers

Author keywords

LPCVD; Silicon nitride; Silicon oxide; Surface passivation

Indexed keywords

CHEMICAL VAPOR DEPOSITION; DEGRADATION; HEAT TREATMENT; HIGH TEMPERATURE OPERATIONS; HYDROGENATION; PASSIVATION; SILICON NITRIDE; SOLAR CELLS; SURFACE PHENOMENA;

EID: 17444429618     PISSN: 10627995     EISSN: None     Source Type: Journal    
DOI: 10.1002/pip.580     Document Type: Article
Times cited : (22)

References (14)
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    • High-efficiency screen-printed silicon ribbon solar cells by effective defect passivation and rapid thermal processing
    • Rohatgi A, Jeong J-W. High-efficiency screen-printed silicon ribbon solar cells by effective defect passivation and rapid thermal processing. Applied Physics Letters 2003; 82(2): 224.
    • (2003) Applied Physics Letters , vol.82 , Issue.2 , pp. 224
    • Rohatgi, A.1    Jeong, J.-W.2
  • 4
    • 0020721235 scopus 로고
    • Post-deposition high temperature processing of silicon nitride
    • Stein HJ, Peercy PS, Sokel RJ. Post-deposition high temperature processing of silicon nitride. Thin Solid Films 1983; 101: 291.
    • (1983) Thin Solid Films , vol.101 , pp. 291
    • Stein, H.J.1    Peercy, P.S.2    Sokel, R.J.3
  • 9
    • 0000513411 scopus 로고    scopus 로고
    • Contactless determination of current-voltage characteristics and minority-carrier lifetimes in semiconductors from quasi-steady-state photoconductance data
    • Sinton RA, Cuevas A. Contactless determination of current-voltage characteristics and minority-carrier lifetimes in semiconductors from quasi-steady-state photoconductance data. Applied Physics Letters 1996; 69(17): 2510.
    • (1996) Applied Physics Letters , vol.69 , Issue.17 , pp. 2510
    • Sinton, R.A.1    Cuevas, A.2
  • 10
    • 0000612857 scopus 로고    scopus 로고
    • Generalized analysis of quasi-steady-state and quasi-transient measurements of carrier lifetimes in semiconductors
    • Nagel H, Berge C, Aberle AG. Generalized analysis of quasi-steady-state and quasi-transient measurements of carrier lifetimes in semiconductors. Journal of Applied Physics 1999; 86(11): 6218.
    • (1999) Journal of Applied Physics , vol.86 , Issue.11 , pp. 6218
    • Nagel, H.1    Berge, C.2    Aberle, A.G.3
  • 11
    • 0030487321 scopus 로고    scopus 로고
    • LPCVD silicon-rich silicon nitride films for applications in micromechanics, studied with statistical experimental design
    • Gardeniers JGE, Tilmans HAC. LPCVD silicon-rich silicon nitride films for applications in micromechanics, studied with statistical experimental design. Journal of Vacuum Science and Technology A 1996; 14(5): 2879.
    • (1996) Journal of Vacuum Science and Technology A , vol.14 , Issue.5 , pp. 2879
    • Gardeniers, J.G.E.1    Tilmans, H.A.C.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.