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Volumn 144-147, Issue , 2005, Pages 753-756

Antiferromagnetic domain modulation of NiO(1 0 0) induced by thickness-dependent interfacial coupling with Cr overlayer

Author keywords

Antiferromagnetic (AFM) domain; X ray magnetic linear dichroism (XMLD); X ray photoemission electron microscopy (XPEEM)

Indexed keywords

ANTIFERROMAGNETISM; CHROMIUM; ELECTRON MICROSCOPY; MAGNETIC FILMS; MAGNETIC RECORDING; MODULATION;

ANTIFERROMAGNETIC DOMAIN; X-RAY MAGNETIC LINEAR DICHROISM (XMLD); X-RAY PHOTOEMISSION ELECTRON MICROSCOPY (XPEEM);

NICKEL COMPOUNDS;

EID: 17444418320 PISSN: 03682048 EISSN: None Source Type: Journal
DOI: 10.1016/j.elspec.2005.01.060 Document Type: Conference Paper

Times cited : (3)

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