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Volumn 27, Issue 8, 2005, Pages 1402-1409

Retraction Notice to “Optical properties and morphological changes in gadolinia films deposited under ambient substrate temperature conditions” [(Opt. Mater.) 27 (8) (May 2005) 1402–1409] (S0925346704003738)(10.1016/j.optmat.2004.10.003);Optical properties and morphological changes in gadolinia films deposited under ambient substrate temperature conditions

Author keywords

Deep UV optical coatings; Gadolinia films; Optical constants; Optical properties; Phase modulated spectroscopic ellipsometry; Rare earth oxides

Indexed keywords

ELLIPSOMETRY; MORPHOLOGY; OPTICAL COATINGS; OPTICAL PROPERTIES; PHASE MODULATION; RARE EARTH COMPOUNDS; SPECTROSCOPIC ANALYSIS; TEMPERATURE DISTRIBUTION; THIN FILMS; ULTRAVIOLET RADIATION;

EID: 17444414221     PISSN: 09253467     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optmat.2017.01.048     Document Type: Erratum
Times cited : (17)

References (13)
  • 1
    • 17044380134 scopus 로고
    • Academic Press New York, San Francisco, London
    • E. Ritter Phys. Thin Films 1975 Academic Press New York, San Francisco, London p. 1
    • (1975) Phys. Thin Films
    • Ritter, E.1
  • 12
    • 0000346911 scopus 로고
    • Light Scattering of Thin Dielectric Films
    • CRC Press
    • A. Duparre Light Scattering of Thin Dielectric Films Hand Book of Optical Properties Vol. 1 1995 CRC Press
    • (1995) Hand Book of Optical Properties , vol.1
    • Duparre, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.